Computational flexoelectronics

A framework for analyzing PN junctions in flexoelectric semiconductors

verfasst von
Han Hu, Zhaowei Liu, Qiong Liu, Xiaoning Jiang, Xiaoying Zhuang, Timon Rabczuk
Abstract

The miniaturization of electronic devices has intensified the need to tailor material properties at the nanoscale, where flexoelectricity becomes prominent. This paper investigates flexoelectronics—a novel field that harnesses strain gradients and flexoelectric polarization to modulate electronic behavior in semiconductors. Existing models often rely on linearized constitutive relations that fail to capture the behavior of semiconductors under large carrier perturbations. To address this limitation, this work presents a novel computational framework for the fully-coupled physics of flexoelectronics based on isogeometric analysis. The framework robustly models the nonlinear interplay among elasticity, flexoelectric polarization, and carrier transport in PN junctions, overcoming the constraints of traditional linearized approaches. Verification against analytical benchmarks confirms the accuracy of the method. Applications to two-dimensional PN junctions reveal a previously unreported competing mechanism between drift and diffusion currents under flexoelectric modulation. Furthermore, the framework demonstrates that device strain sensitivity is a tunable property that can be optimized by adjusting the junction's position, providing a clear pathway for enhanced flexoelectronic device design.

Organisationseinheit(en)
Institut für Photonik
Externe Organisation(en)
Hohai University
North Carolina State University
Tongji University
Bauhaus-Universität Weimar
Typ
Artikel
Journal
International Journal of Mechanical Sciences
Band
305
ISSN
0020-7403
Publikationsdatum
01.11.2025
Publikationsstatus
Veröffentlicht
Peer-reviewed
Ja
ASJC Scopus Sachgebiete
Tief- und Ingenieurbau, Allgemeine Materialwissenschaften, Luft- und Raumfahrttechnik, Physik der kondensierten Materie, Meerestechnik, Werkstoffmechanik, Maschinenbau, Angewandte Mathematik
Elektronische Version(en)
https://doi.org/10.1016/j.ijmecsci.2025.110740 (Zugang: Offen)
 

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